DALLAS - Texas Instruments Incorporated (TI) today announced a 13-bit, 210MSPS
analog-to-digital converter (ADC) featuring 68dB signal-to-noise ratio (SNR) and 79dB spurious-free dynamic range
(SFDR), at the maximum sample rate of 210MSPS and an input frequency of 230MHz. This breakthrough dynamic
performance achieved by the new ADS5440 enables improved receiver performance in a multitude of applications
including software defined radios, basestation power amplifier linearization systems, as well as test and
measurement systems.
"The ADS5440 leverages TI's unique, high-speed BiCom-III
complementary bipolar Si-Ge process to deliver the highest SNR and SFDR performance at high input frequencies," said
Roberto Sadkowski, Business Unit Manager for TI's high-speed ADCs.
The ADS5440 operates from a 5V
supply, while providing LVDS-compatible digital outputs from a 3.3V supply. In addition, an internal reference and
input buffer simplifies system design requirements. The device is specified over the industrial temperature range of
-40C to +85C.
The ADS5440 is optimized to work with TI's high-performance
TMS320C6xTM DSP platform and a range of high-speed amplifiers and digital-to-analog
converters, such as the THS4509 fully differential amplifier and DAC5687 16-bit, 500MSPS DAC, to provide a truly
state-of-the-art signal chain for wideband applications. |