Foros Electrónica
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Es más frecuente que la confianza sea generada por la ignorancia que por el conocimiento: son los que conocen poco y no los que conocen mucho, los que afirman tan positivamente que este o aquel problema nunca será solucionado por la ciencia.

Charles Darwin (1809-1892).
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  DALLAS - Texas Instruments Incorporated (TI) today announced a 13-bit, 210MSPS analog-to-digital converter (ADC) featuring 68dB signal-to-noise ratio (SNR) and 79dB spurious-free dynamic range (SFDR), at the maximum sample rate of 210MSPS and an input frequency of 230MHz. This breakthrough dynamic performance achieved by the new ADS5440 enables improved receiver performance in a multitude of applications including software defined radios, basestation power amplifier linearization systems, as well as test and measurement systems.

"The ADS5440 leverages TI's unique, high-speed BiCom-III complementary bipolar Si-Ge process to deliver the highest SNR and SFDR performance at high input frequencies," said Roberto Sadkowski, Business Unit Manager for TI's high-speed ADCs.

The ADS5440 operates from a 5V supply, while providing LVDS-compatible digital outputs from a 3.3V supply. In addition, an internal reference and input buffer simplifies system design requirements. The device is specified over the industrial temperature range of -40C to +85C.

The ADS5440 is optimized to work with TI's high-performance TMS320C6xTM DSP platform and a range of high-speed amplifiers and digital-to-analog converters, such as the THS4509 fully differential amplifier and DAC5687 16-bit, 500MSPS DAC, to provide a truly state-of-the-art signal chain for wideband applications. 


Miércoles, 20 Julio, 2005 - 01:00
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