|Alguien dijo ...|
|Los hechos no dejan de existir solo porque sean ignorados,|
Thomas Henry Huxley(1825-1895).
Naturalista evolucionista inglés
| Cadence and Advantest Address Zero-Defect Testing Requirements for Automotive Electronics|
SAN JOSE, Calif. and TOKYO , Cadence Design Systems, Inc., the leader in global electronic-design innovation, and Advantest Corporation (TSE: 6857, NYSE: ATE), the global leader in semiconductor test today, announced a collaborative partnership to deliver a methodology for zero-defect testing of digital automotive electronics. The collaboration will enable faster time-to-market and more complete testing of complex digital devices for new automobiles.
Diverging sharply from their analog roots, automotive manufacturers today are driving their suppliers to advanced semiconductor technology in support of high-value automotive applications. They are also demanding just-in-time delivery and, to reduce their risk, zero defects. This combination of factors requires a faster, more accurate testing methodology to achieve the same high quality and low risk.
Using Advantest's automated test equipment (ATE) platforms, the collaboration combines traditional analog part average testing (PAT) techniques with the industry leading small delay defect detection capabilities of the Cadence® Encounter® True-Time Test software to produce a new generation of single-pass test methodologies for zero-defect testing of digital parts.
Cadence Encounter Test, a key component of the Cadence Encounter digital IC design platform, delivers the industry's most advanced test solution from RTL to silicon. Key technologies include Power-Aware ATPG methods to reduce power during test, test-data compression to lower cost of test, True-Time delay test to detect small delay defects. In combination, with Encounter Diagnostics for accelerated yield ramp, these technologies provide the highest quality of shippable silicon.
"The Cadence Encounter True-Time Test ATPG will allow us to create a single-pass and fully integrated test methodology for zero-defect digital designs, increasing product quality and reducing time to market and risk," said Shinichiro Umeda, senior vice president of Software Development Group at Advantest. "It's a focused collaboration to provide specific benefits to the automotive industry, but will be applicable elsewhere as well."
"Although this is a deep collaboration, from the standpoint of the automotive design chain, it has important benefits not just for Cadence and Advantest, but for our customers, their customers, and ultimately the individual car buyer," said Sanjiv Taneja, vice president of R&D for Encounter Test at Cadence. "By ensuring the quality of digital electronics in automobiles, we ensure the reliability of a dozen or more major components in every new car."
Advantest Corporation is the world's leading automatic test equipment supplier to the semiconductor industry, and also produces electronic and optoelectronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its logic, memory, mixed-signal and RF testers and device handlers are integrated into the most advanced semiconductor production lines in the world. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has 40 subsidiaries worldwide. Among them, Advantest America, Inc. is based in Santa Clara, Calif., and Advantest (Europe) GmBH is based in Munich, Germany. More information is available at www.advantest.co.jp.
Sábado, 09 Diciembre, 2006 - 10:42