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2000 Fairchild Semiconductor Corporation
DS009454
www.fairchildsemi.com
December 1994
Revised September 2000
7
4
F00 Quad
2-
Input
NAND Gat
e
74F00
Quad 2-Input NAND Gate
General Description
This device contains four independent gates, each of which
performs the logic NAND function.
Ordering Code:
Devices also available in Tape and Reel. Specify by appending the suffix letter X to the ordering code.
Logic Symbol
IEEE/IEC
Connection Diagram
Unit Loading/Fan Out
Order Number
Package Number
Package Description
74F00SC
M14A
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow
74F00SJ
M14D
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
74F00PC
N14A
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Pin Names
Description
U.L.
Input I
IH
/I
IL
HIGH/LOW
Output I
OH
/I
OL
A
n
, B
n
Inputs
1.0/1.0
20
A/
-
0.6 mA
O
n
Outputs
50/33.3
-
1 mA/20 mA
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2
74F00
Absolute Maximum Ratings
(Note 1)
Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
AC Electrical Characteristics
Storage Temperature
-
65
C to
+
150
C
Ambient Temperature under Bias
-
55
C to
+
125
C
Junction Temperature under Bias
-
55
C to
+
150
C
V
CC
Pin Potential to Ground Pin
-
0.5V to
+
7.0V
Input Voltage (Note 2)
-
0.5V to
+
7.0V
Input Current (Note 2)
-
30 mA to
+
5.0 mA
Voltage Applied to Output
in HIGH State (with V
CC
=
0V)
Standard Output
-
0.5V to V
CC
3-STATE Output
-
0.5V to
+
5.5V
Current Applied to Output
in LOW State (Max)
twice the rated I
OL
(mA)
ESD Last Passing Voltage (Min)
4000V
Free Air Ambient Temperature
0
C to
+
70
C
Supply Voltage
+
4.5V to
+
5.5V
Symbol
Parameter
Min
Typ
Max
Units
V
CC
Conditions
V
IH
Input HIGH Voltage
2.0
V
Recognized as a HIGH Signal
V
IL
Input LOW Voltage
0.8
V
Recognized as a LOW Signal
V
CD
Input Clamp Diode Voltage
-
1.2
V
Min
I
IN
=
-
18 mA
V
OH
Output HIGH
10% V
CC
2.5
V
Min
I
OH
=
-
1 mA
Voltage
5% V
CC
2.7
I
OH
=
-
1 mA
V
OL
Output LOW
10% V
CC
0.5
V
Min
I
OL
=
20 mA
Voltage
I
IH
Input HIGH
5.0
A
Max
V
IN
=
2.7V
Current
I
BVI
Input HIGH Current
7.0
A
Max
V
IN
=
7.0V
Breakdown Test
I
CEX
Output HIGH
50
A
Max
V
OUT
=
V
CC
Leakage Current
V
ID
Input Leakage
4.75
V
0.0
I
ID
=
1.9
A
Test
All other pins grounded
I
OD
Output Leakage
3.75
A
0.0
V
IOD
=
150 mV
Circuit Current
All other pins grounded
I
IL
Input LOW Current
-
0.6
mA
Max
V
IN
=
0.5V
I
OS
Output Short-Circuit Current
-
60
-
150
mA
Max
V
OUT
=
0V
I
CCH
Power Supply Current
1.9
2.8
mA
Max
V
O
=
HIGH
I
CCL
Power Supply Current
6.8
10.2
mA
Max
V
O
=
LOW
Symbol
Parameter
T
A
=
+
25
C
T
A
=
-
55
C to
+
125
C
T
A
=
0
C to
+
70
C
Units
V
CC
=
+
5.0V
V
CC
=
+
5.0V
V
CC
=
+
5.0V
C
L
=
50 pF
C
L
=
50 pF
C
L
=
50 pF
Min
Typ
Max
Min
Max
Min
Max
t
PLH
Propagation Delay
2.4
3.7
5.0
2.0
7.0
2.4
6.0
ns
t
PHL
A
n
, B
n
to O
n
1.5
3.2
4.3
1.5
6.5
1.5
5.3
3
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74
F
0
0
Physical Dimensions
inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow
Package Number M14A
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4
74F00
Physical Dimensions
inches (millimeters) unless otherwise noted (Continued)
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
5
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7
4
F00 Quad
2-
Input
NAND Gat
e
Physical Dimensions
inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N14A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be rea-
sonably expected to result in a significant injury to the
user.
2. A critical component in any component of a life support
device or system whose failure to perform can be rea-
sonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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