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Cuando un científico prestigioso pero anciano afirma que algo es imposible, lo más probable es que esté equivocado.

Arthur Clarke(1917).
Escritor de divulgación científica y de ciencia ficción.
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Samsung Electronics Reveals Industry's First Gigabit-density Mobile DRAM
Seoul, Korea - : Samsung Electronics Co., Ltd., the world leader in advanced memory technology, announced that it has developed the industry's first one gigabit (Gb) Mobile DRAM (dynamic random access memory) for mobile products, using 80nm process technology.
Leer la noticia completa Jueves, 28 Diciembre, 2006 - 10:18

LeCroy Announces Agreement with TOYO Corporation To Distribute and Support LeCroy Products in Japan
LeCroy Corporation, a leading supplier of protocol analyzers, oscilloscopes and serial data test solutions, today announced that an agreement has been reached with TOYO Corporation, the leading distributor of test equipment in Japan, for exclusive distribution of LeCroy’s full product line of protocol analyzers, protocol exercisers, error injectors, and associated accessories in Japan.
Leer la noticia completa Jueves, 28 Diciembre, 2006 - 10:14

IDT Awards Phoenix Precision Technology Corporation as Supplier of the Year
San JOSE, Calif., — IDT™ (Integrated Device Technology, Inc.), a leading provider of vital semiconductor solutions, announced today that it has awarded Phoenix Precision Technology Corporate as its 2006 Supplier of the Year.
Leer la noticia completa Jueves, 28 Diciembre, 2006 - 10:11

 
IBM and Siemens Business Services to Modernize IT for the German Federal Armed Forces
BERLIN - : The German Federal Armed Forces have commissioned a consortium consisting of Siemens Business Services and IBM to modernize and manage its non-military information and communications technology.
Leer la noticia completa Jueves, 28 Diciembre, 2006 - 10:09

IBM's Developer Community Achieves Record Growth in 2006 and Advances Open Source Development
ARMONK, NY - IBM today announced that its developer community has grown at an unprecedented rate this year, with nearly 1,700 worldwide developers joining its growing community per day.
Leer la noticia completa Jueves, 28 Diciembre, 2006 - 10:07

 
Federal Court Orders Intel Corporation and Third Parties To Produce Foreign Discovery in AMD VS. INTEL U.S. Antitrust Suit
SUNNYVALE, Calif. -- AMD today announced a significant legal victory in its ongoing antitrust suit against Intel Corporation.
Leer la noticia completa Jueves, 28 Diciembre, 2006 - 10:04

IBM Milestone Demonstrates Optical Device to Advance Computer Performance
YORKTOWN HEIGHTS, NY - : IBM today announced its researchers have built a device capable of delaying the flow of light on a silicon chip, a requirement to one day allow computers to use optical communications to achieve better performance.
Leer la noticia completa Martes, 26 Diciembre, 2006 - 08:19

 
Cypress And UPEK Partner On Biometric Security Reference Design For Safe, Convenient Access To USB Flash Drives
SAN JOSE, Calif. and EMERYVILLE, Calif. - Cypress Semiconductor Corp. and UPEK®, Inc. today introduced a reference design for USB Flash Drives (UFDs) protected by fingerprint authentication technology, delivering the industry's strongest security by authenticating users on the UFD system instead of on a PC.
Leer la noticia completa Martes, 26 Diciembre, 2006 - 08:16

PMC-Sierra Provides Update to Q4 2006 Business Outlook
SANTA CLARA, Calif.-- PMC-Sierra, Inc., a leading provider of high-speed broadband communications and storage semiconductors, today is providing an update to its business outlook for the fourth quarter of 2006.
Leer la noticia completa Jueves, 21 Diciembre, 2006 - 07:39

 
New Vishay Micro-Measurements System 7000 Has Measurement Accuracy of ±0.05 %, Measurement Resolution of 0.5 Microstrain, and Scan Rates Up to 2048 Samples Per Second
MALVERN, PENNSYLVANIA — Vishay Intertechnology, Inc. announces the release of System 7000. Designed for use with Vishay Micro-Measurements StrainSmart software, System 7000 has all the features needed to acquire, reduce, and present data from strain gages and related sensors for stress analysis testing.
Leer la noticia completa Jueves, 21 Diciembre, 2006 - 07:34

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