Keithley Introduces New Pulse Measurement Solution for Semiconductor Device Characterization Cleveland, Ohio - Keithley Instruments, Inc. announces the availability of pulse generation and measurement in the Model 4200-SCS Semiconductor Characterization System. Completely integrated in a compact form factor, the new PIV (Pulse I-V) Package enables superior measurements and faster time-to-market for leading-edge researchers working with high-k materials, thermally sensitive devices, and advanced memory chips. It is the first commercially available solution to offer accurate and repeatable pulse and DC measurements in an easy-to-use, integrated package. Leer la noticia completa Lunes, 18 Julio, 2005 - 06:00

STMicroelectronics Unveils First in Family of Configurable System-on-Chip ICs Geneva – STMicroelectronics today revealed successful fabrication of the first of a family of configurable System-on-Chip ICs that addresses a variety of applications, including digital engines for printers, scanners and other embedded control applications, and provides ST customers with a complete roadmap to cover current and future needs. Leer la noticia completa Lunes, 18 Julio, 2005 - 06:00

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